Wafer appearance inspection equipment - Company Ranking(4 companyies in total)
Last Updated: Aggregation Period:Jul 16, 2025〜Aug 12, 2025
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Product Image, Product Name, Price Range | overview | Application/Performance example | |
【Specifications】 ■Target Products: System LSI, Flash Memory, CMOS Devices, etc. ■Wafer Size: 12 inches ■Defect Items: Pattern defects, scratches, color unevenness, foreign substances, etc. ■Camera: 4 million pixels, color ■Lighting: Coaxial incident lighting, oblique ring lighting ■Inspection Magnification: 2.5x, 5x, 10x (with active autofocus) ■Resolution: 1.1μm/pixel (5x) ■Processing Capability: Approximately 2.5 minutes/(12 inches), 2.2 resolution ■Options: In-car, communication specifications ■Equipment Size: W1,600×D2,500×H1,800mm *For more details, please refer to the PDF document or feel free to contact us. | For more details, please refer to the PDF document or feel free to contact us. | ||
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- Featured Products
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Wafer Appearance Inspection System "OVS-5120 Series"
- overview
- 【Specifications】 ■Target Products: System LSI, Flash Memory, CMOS Devices, etc. ■Wafer Size: 12 inches ■Defect Items: Pattern defects, scratches, color unevenness, foreign substances, etc. ■Camera: 4 million pixels, color ■Lighting: Coaxial incident lighting, oblique ring lighting ■Inspection Magnification: 2.5x, 5x, 10x (with active autofocus) ■Resolution: 1.1μm/pixel (5x) ■Processing Capability: Approximately 2.5 minutes/(12 inches), 2.2 resolution ■Options: In-car, communication specifications ■Equipment Size: W1,600×D2,500×H1,800mm *For more details, please refer to the PDF document or feel free to contact us.
- Application/Performance example
- For more details, please refer to the PDF document or feel free to contact us.
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